The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 1981

Filed:

Nov. 22, 1978
Applicant:
Inventors:

David H Savidge, Rotherham, GB;

Eric Wadsworth, Sheffield, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ;
U.S. Cl.
CPC ...
324225 ; 324237 ;
Abstract

Inspection equipment for detecting defects in the surface of steel billets or other elongate members includes high-frequency energized eddy-current surface scanning probe which transmits signals representative of the surface condition and the probe surface spacing to a dual-channel receiver. The signals from both channels of the receiver are combined to provide outputs representative of the surface condition compensating for changes in sensitivity resulting from changes in the probe spacing during scanning. Probes may be positioned above the plane surfaces and/or the corners of the billet. The latter being positively located through rollers which bear against the two sides of the billet which flank the edge under inspection.


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