The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 1981
Filed:
Dec. 20, 1979
Gus P Tricoles, San Diego, CA (US);
Eugene L Rope, El Cajon, CA (US);
General Dynamics Corporation, Electronics Division, San Diego, CA (US);
Abstract
A method and apparatus for measuring radiant energy scattering characteristics of a test panel of dielectric material over a sphere are disclosed. The test panel is supported on a turntable at a position on the axis of the turntable. The turntable has a first antenna radially mounted thereon for rotation therewith and directed toward the position of the supported test panel. A second antenna is mounted for selective positioning along a circular arc within a plane that includes the axis of the turntable, which arc extends at least ninety degrees from said axis, wherein the second antenna is radially directed toward the position of a test panel that is axially supported on the turntable at all positions along said arc. The test panel support is rotated with respect to the turntable to selectively position the test panel at a predetermined incidence angle with respect to the first antenna. The turntable is rotated with respect to the second antenna to selectively position the test panel at an angle with respect to the axis of propagation of the second antenna that is equal to and opposite the predetermined incidence angle. Radiation transmitted between the first and second antenna is measured with the test panel in the supported position at each of a plurality of predetermined equal and opposite incidence angles with respect to the first and second antennas; and radiation transmitted between the first and second antennas is measured at each of the plurality of predetermined incidence angles when the test panel is not supported on the turntable. The second antenna is position at a plurality of positions along the circular arc at various ones of the predetermined incidence angles at which measurements are made as described above. Further measurements are made, both with the test panel in its supported position on the turntable and with test panel absent, of the radiation transmitted between the first and second antennas at the plurality of positions along the circular arc at the various ones of the predetermined incidence angles. The reflectance characteristics of the test panel are then determined by subtracting the measurements taken without the test panel in place from those taken with the test panel supported on the turntable.