The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 1981
Filed:
Jan. 16, 1980
Herbert Goebel, Munich, DE;
Siemens Aktiengesellschaft, Berlin & Munich, DE;
Abstract
An X-ray powder diffractometer functioning as a goniometer is disclosed wherein a monochromatic X-ray source is provided together with a sample to be analyzed and a detector means with position sensitive behavior. A transport system for digitally controllable advance drive is provided so as to advance the detector along an arc suited for a Guinier method for transmission and/or back reflection beam direction. An electronic analysis system is provided for preparing an intensity diagram of a local distribution of diffracted radiation for a given position location 2.theta. of the detector. The analysis system includes an amplifier/discriminator for delivering a time signal corresponding to the position/location of a respective single photon event received from the detector. A time-digital converter connected to the amplifier/discriminator is also provided together with a multichannel analyzer connected to the time-to-digital converter by a digital adder. The position-sensitive detector is located diametrically opposite the sample on the Guinier circle so as to form an assembly. This assembly is rotated in the primary beam such that the primary beam always impinges on the sample, and the detector is always in a focus of the diffracted radiation.