The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 1981
Filed:
Nov. 14, 1979
John E Lillig, Diamond Bar, CA (US);
Beckman Instruments, Inc., Fullerton, CA (US);
Abstract
In a system which measures a parameter of a sample and displays information relating thereto, a circuit including the component elements of the system for testing signal levels at test points within the system and for displaying the test signal levels. Switching means places the system in either a transducing mode for measuring the parameter or in a combined transducing/self-testing mode for simultaneous testing during transducing operation. The testing circuit includes an operator manipulated probe for contacting any of the test points and an analog multiplexer input of the system for multiplexing the probe test signal and the transducing signal. The multiplexed signals are converted to digital form and processed by the system's computer for display. In the combined transducing/self-testing mode, the probe test signal information is outputted to the system display while the transducing output thereto is inhibited. The transducing output information derived during testing is processed and stored by the computer for subsequent display.