The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 1981
Filed:
Dec. 15, 1978
Wolfram Breuer, Leverkusen, DE;
Wolf-Jurgen Becker, Leverkusen, DE;
Jacques Deprez, Frechen, DE;
Eckard Drope, Cologne, DE;
Karl-Heinz Kaufmann, Langenfeld-Immigrath, DE;
Kurt Schreckling, Leverkusen, DE;
Bayer Aktiengesellschaft, Leverkusen, DE;
Abstract
An apparatus for checking gas analysis devices in respect of their sensitivity and their response and regeneration behaviour with respect to time, wherein a reproducible quantity of the measurement component is produced at a predetermined production rate, for a period of time which is guided entirely or at a constant proportion as a concentration pulse to the measurement element of the gas analysis device. For the production of the measurement component a chemical or electro-chemical reaction or even a thermal reaction is used. The time interval can then be conveniently controlled. A decisive advantage with toxic measurement components is that the gas production takes place in all cases for only a short time during the test procedure.