Transient microcode block check word generation control circuitry

Abstract

Control circuitry is provided for controlling the generation of a block check word simultaneously with the writing of control words into a transient area of a writeable control storage. The control circuitry in response to a write control storage instruction generates control signals for controlling existing central processing unit (CPU) hardware to effect generation of the block check word while a control word is being written into the transient area of control storage. Microinstructions in the resident area for performing the overlay force selection of a local storage register which has been initialized. The operand from the local storage register is applied to the ALU together with the word which is also being written into control storage. The ALU is forced to perform an exclusive OR operation and the result is returned to the selected LSR. In this manner a block check word is dynamically calculated word by word as each word is written into control storage. When all the control words have been loaded into control storage, a pre-calculated block check word is retrieved from main storage and compared with the calculated block check word. A miscompare indicates that the group of control words written into control storage had been modified when resident in main storage.