The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 1981
Filed:
Jun. 20, 1977
J Howard Marshall, III, Pasadena, CA (US);
MDH Industries, Inc., Monrovia, CA (US);
Abstract
In an apparatus for neutron-capture-based on-line elemental analysis of bulk substances, the control of neutrons which escape from the volume in which the analyzed substance is placed improves accuracy and reduces potential radiation hazards. The apparatus includes a neutron source, which exposes the analyzed bulk substance momentarily contained within the instrument to a flux of neutrons. The analyzed substance captures some of these neutrons by (n,.gamma.) reactions, producing prompt gamma rays which are detected to provide the composition measurement. The placement of neutron absorbers around the volume containing the bulk substance and the neutron source and the proper geometrical relationship between the various parts of the instrument provide this neutron control. The materials used in controlling escaping neutrons and in the instrument structure are chosen to avoid interfering radiations. The materials and geometries herein provide neutron control in a manner which does not add significantly to the number of detected background events resulting from the scattering of measured capture gamma rays or from the production of additional gamma rays in the neutron-absorbing materials or in the surrounding structure. Absorbing and controlling escaping neutrons provides fewer neutron interactions in the gamma-ray detector and less scattering of the capture gamma rays, resulting in improved accuracies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile