The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 1981
Filed:
Jul. 07, 1978
Applicant:
Inventor:
Benno Reuter, Lohof, DE;
Assignee:
Gesellschaft fur Strahlen-und Umweltforschung mbH, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
250311 ; 250272 ; 250321 ; 250365 ; 2504 / ;
Abstract
In apparatus for examining the material of a specimen with local resolution employing an X-ray probe and operating according to the scanning principle, including a source of X-ray radiation, an optical system for directing X-ray radiation from the source onto the specimen, and a detector disposed for detecting radiation appearing behind the specimen, the source is constituted by a target in which the X-ray radiation is generated, and the optical system acts to focus the X-ray radiation emanating from the target onto the specimen in the form of an X-ray probe.