The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 1981
Filed:
Sep. 17, 1979
Taki Negas, Ijamsville, MD (US);
Louis P Domingues, Silver Spring, MD (US);
Tadeusz M Drzewiecki, Silver Spring, MD (US);
Richard M Phillippi, Highland, MD (US);
The United States of America as represented by the Secretary of the Army, Washington, DC (US);
Abstract
A device for measuring the fugacity of a material, without requiring a separate device to measure temperature, is disclosed, wherein the device is a solid electrolyte probe, with the probe having a passageway therein, and metallic conductor leads on the outside of the probe and on the inside of the probe in the passageway. The metallic conductor leads are in contact with an E.M.F. measuring circuit, with the reference fluid being passed through the passageway. The passageway also includes a capillary restriction therein, and measuring devices are provided to measure the pressure drop of the reference fluid when flowing through the capillary, thereby permitting determination of temperature. The temperature determination combined with the E.M.F. measurement permit determination of the fugacity of the material.