The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 1981
Filed:
May. 04, 1979
Ruslan I Batyrev, Moscow, SU;
Semen I Gdalin, Moscow, SU;
Boris F Zaretsky, Moscow, SU;
Vladimir E Terekhin, Moscow, SU;
Valentin G Semenov, Moscow, SU;
Viktor V Malinin, Moscow, SU;
Jury V Popov, Moscow, SU;
Alexandr S Kechekian, Moscow, SU;
Other;
Abstract
A method of determining the quality of oriented polymeric materials, based on the effect of small-angle scattering, comprises the passage of a beam of monochromatic, polarized and collimated light through a given material, extracting the scattered reflections, converting them to a train of electric pulses, and determining the degree of orientation of the material using the pulse spacing. An apparatus for determining the quality of oriented polymeric materials comprises a source which produces monochromatic, polarized and collimated light passed through an oriented polymeric material, and a housing which accommodates an analyzer, a mask and a scattered reflection converting unit to convert the scattered reflections extracted by the mask to a train of electric pulses, which are arranged serially along the direction of the light beam after the material. The scattered reflection converting unit comprises a scattered light detector coupled to the recorder.