The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 1981

Filed:

Jun. 04, 1979
Applicant:
Inventors:

Haruo Uchiyama, Kawasaki, JP;

Junichi Kimizuka, Tokyo, JP;

Kazuo Hoshido, Kawasaki, JP;

Yukio Isaka, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350-68 ; 355 10 ; 358199 ; 358293 ;
Abstract

A beam scanning device provided with a beam generator to generate beam, a deflector to deflect the beam, and a beam detector to detect the deflected beam. In this beam scanning device, while the beam detector is detecting the beam with a definite cycle, the beam generator is so controlled that the beam may be generated therefrom with such definite cycle, and the beam is constantly generated from the beam generator when the beam detector becomes unable to detect the beam with such definite cycle. By thus controlling the beam generation, the beam detection can be carried out rapidly, even when the cycle for the beam detection shifts or noises enter during the beam detection.


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