The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 1981

Filed:

Jun. 28, 1979
Applicant:
Inventor:

Herbert M Runciman, Glasgow, GB;

Assignee:

Barr & Stroud Limited, Glasgow, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250494 ; 2505 / ; 250503 ;
Abstract

Apparatus for assessing the thermal sensitivity of optical systems comprises a test target 4 in the form of a plate in which slits 11 are cut at a predetermined spatial frequency. Radiation from a heated bar 1 is reflected from two separate portions thereof on opposite faces A,B of the bar to the test target 4 by concave mirrors 2, 3, radiation from one mirror 3 being reflected by the test target 4 and radiation from the other mirror 2 being transmitted through the slits 11 of test target 4 so that the resulting radiation passes along a common path 9 to a collimator 8 and hence to the optical system under test. The bar 1 may be heated at one end and cooled at the other end such that a temperature gradient is produced along the length of the bar. The above mentioned other mirror 2 is mounted in a movable holder 10 which, by means of a micrometer device 7 can be adjusted along the length of the bar 1 so that the radiation at the test target 4 emerges from portions of the bar 1 which are at different temperatures.


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