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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 4263510 B1

PDFFull Text
Date of Patent:
Apr. 21, 1981

Filed:

Jul. 30, 1979

Combined x-ray diffraction and fluorescence spectroscopy apparatus with

Applicant:
Inventors:

Michael F Ciccarelli, Troy, NY (US);

Raymond P Goehner, Clifton Park, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:

MaLossi; Leo I.

Davis, Jr.; James C.

Primary Examiner:

Alfred E Smith

Assistant Examiner:

Carolyn E Field

Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250272 ; 2502 / ;
Abstract

The sensitivity of XRD-XRF apparatus for elements having atomic no. below 16 can be substantially increased by use of an environmentally controllable three-cylinder x-ray path chamber in combination with such apparatus. Use of the chamber has surprisingly been found to sufficiently increase the sensitivity so that element-identifying or characteristic lines of elements having atomic numbers at least as low as 10 can be measured by the improved XRD-XRF apparatus of this invention.

Find Patent Forward Citations

Ciccarelli, Michael. (1981). Combined x-ray diffraction and fluorescence spectroscopy apparatus with (U.S. Patent No. 4263510). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4263510

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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