The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 1981

Filed:

Apr. 20, 1979
Applicant:
Inventors:

James F Leary, Rochester, NY (US);

Paul Todd, State College, PA (US);

Assignee:

Research Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
2503 / ; 2504 / ; 356335 ;
Abstract

Method and apparatus for analyzing pulses from optical devices such as flow cytometers to generate indicators of particle dimensional attributes, such as size and shape, as well as orientations in a flow stream of non-spherical particles. Particles are conveyed through a beam of electromagnetic radiation and a photodetector responds to radiation resulting from interaction of the particle with the beam to output a resultant signal in the form of a pulse as a particle enters and passes through the beam. Pulse edge width between two threshold values, preferably established as constant fractions of peak pulse amplitude, is measured as an indication of a particle dimensional attribute.


Find Patent Forward Citations

Loading…