The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 1981
Filed:
Jun. 14, 1979
Cole H Baker, Westport, CT (US);
Intec Corporation, Trumbull, CT (US);
Abstract
A wide web laser scanner flaw detection method and apparatus are provided for rapid and accurate inspection of wide web materials. A plurality of laser sources are scanned by a plurality of aligned synchronized rotary scanners which repetitively scan the sources in sequence on a predetermined scan path over the material being examined with each laser scanning only a portion of the scan line. The rotary scanners are selectively blanked in sequence such that only one rotary scanner is scanning a single laser beam on only a portion of a line scan on the material in any given time interval and the blanking means are staggered such that one complete line scan is formed across the material by consecutive sequential alternating scans of each of the laser sources by each of the rotary scanners. The wide web is moved in a direction transversely with respect to the direction of the scan line for providing a raster type scan pattern along the wide web of material being inspected. Receiver means having detector means therein are positioned for receiving radiation applied by the laser beams from the material being inspected with the detector means generating signals in response to the intensity of the radiation received from the material being inspected by the laser beams. A single electronic processing console is provided having the detector signals applied thereto for processing the signals to detect and locate flaws in the material being inspected.