The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 1981
Filed:
Sep. 28, 1979
Sadao Takahashi, Katsuta, JP;
Yoshiaki Katoh, Katsuta, JP;
Hitachi, Ltd., , JP;
Abstract
A linked scan type mass spectrometer wherein the mass number of a metastable ion originating from a precursor ion is measured by scanning the magnetic and electric fields at a constant ratio between the two fields. Calculation is performed on a first electrical signal representative of the mass number of the precursor ion, a second electrical signal corresponding to a value of the electric field at which the mass number of the precursor ion is detected, and a third electrical signal corresponding to a value of the electric field at which the metastable ion is detected during scanning of the electric field and magnetic field, to thereby determine the mass number of the metastable ion. The third electrical signal is obtained by measuring a value of the magnetic field which contributes to the dispersion of ions. Means is provided for correcting the measured value of the magnetic field, thereby determining the mass number of the metastable ion with high accuracy.