The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 1981

Filed:

Jun. 09, 1978
Applicant:
Inventors:

Seiji Miyata, Ohi, JP;

Masatake Akagawa, Yachiyo, JP;

Masahiro Yamamoto, Tokyo, JP;

Noboru Inoue, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128731 ; 364417 ;
Abstract

In a brain-wave analysis apparatus, an electrical brain-wave signal is analyzed for purposes of diagnosis by detecting the time interval between adjacent ones of the intersections of the brain-wave signal with a predetermined level, and the peak value and the wave-form area of the brain-wave signal in the said time interval, or the amplitude value of the brain-wave signal every constant period of time. The said time intervals, peak values, wave form areas, and amplitude values are each classified according to their magnitude, accumulated and stored; and said information is used to prepare histograms. The histograms are analyzed by a processor to obtain their standard deviations, and variations in the standard deviations with time are displayed or recorded to provide a basis for diagnosing living body conditions.


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