The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 1981
Filed:
Sep. 12, 1979
Richard A Sanford, Bartlesville, OK (US);
William H Dennis, Bartlesville, OK (US);
Philips Petroleum Company, Bartlesville, OK (US);
Abstract
A quantitative analysis of the concentration of an eluted component, the dielectric constant of an eluted component and/or the refractive index of the eluted component is obtained using a chromatographic analyzer in combination with both a refractive index detector and a dielectric constant detector without the need to calibrate either the refractive index detector or the dielectric constant detector for each component in a sample. The dielectric constant detector and the refractive index detector are utilized to analyze a sample provided from a chromatographic analyzer. The concentration of the eluted component is a function of the magnitude of the output from each of the detectors. In like manner, the dielectric constant of the eluted component and the refractive index of the eluted component is a function of the output from the two detectors. The magnitude of the output from the two detectors is combined to give the concentration of an eluted component, the dielectric constant of the eluted component and the refractive index of the eluted component without the necessity of calibrating the detectors for each component in a sample.