The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 1981

Filed:

Nov. 21, 1979
Applicant:
Inventors:

William J Smythe, Canterbury, CT (US);

Jack Isreeli, Mamaroneck, NY (US);

Milton H Pelavin, Chappaqua, NY (US);

Assignee:

Technicon Instruments Corporation, Tarrytown, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
2323 / ; 422 82 ; 2323 / ;
Abstract

A sample analyzing system features a number of discrete sample segments continuously conveyed along a conduit. Each sample segment receives a precise aliquot of one or more reagents on a selective basis, and in any particular sequence. Selective injection of the reagent into the moving stream of sample segments allows for an increase in the efficiency and throughput of the sample processing.


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Smythe, William. (1981). Method and apparatus for automated analysis of fluid samples (U.S. Patent No. 4253846). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4253846

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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