The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 1981
Filed:
Feb. 23, 1979
Kazuo Minoura, Yokohama, JP;
Masaaki Ishii, Kawasaki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An optical system for scanning is disclosed which comprises an afocal optical system and a first - and a second deflecting members so disposed respectively at an optically conjugate position relative to the afocal optical system as to substantially interpose the system therebetween. The plane formed by a beam deflected by the first deflecting member is substantially coincident with that formed by a beam deflected by the second one. In order to control the angle of deviation (deflection) of the beam finally scanned, there is provided, for the afocal optical system, means for differentiating the exit angle from the incident angle of a beam passing through the afocal optical system. Furthermore, the angle of deflection of a beam deflected by the first deflecting member in a unit time period is made different from that deflected by the second one.