The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 1981
Filed:
Jun. 26, 1978
Hendricus G Loos, Laguna Beach, CA (US);
Other;
Abstract
A method for measurement of the size distribution of particles suspended in a gas or in a liquid. The particle suspension is illuminated by a collimated beam of nearly monochromatic light. Part of the light scattered by the particles is collected by a lens and is passed through a spatial filter placed in the focal plane of the lens. The light transmitted by the filter is measured by a photodetector. The photodetector output is measured as different spatial filters are switched in place. A computer, microprocessor, or analog device acts on the measured values and produces the particle size distribution as an output. The data reduction algorithm consists of a linear transformation of the measured data vector, followed by the construction of a linear combination of basis functions for the size distribution. The spatial filters consist of transparencies with non-uniform transmittance functions. The average scattering angle is not restricted, but for broad polydisperse particle distributions near back scatter is preferred, in order to avoid an ill-conditioned data reduction problem. One of the spatial filters has a uniform transmittance for the purpose of background light subtraction, and to provide a bias in order to allow effectively indefinite filter transmittance functions.