The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 1981

Filed:

Jul. 01, 1977
Applicant:
Inventor:

Richard S Kampf, Costa Mesa, CA (US);

Assignee:

Beckman Instruments, Inc., Fullerton, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B65G / ;
U.S. Cl.
CPC ...
198339 ; 250328 ; 308 / ; 414403 ;
Abstract

A sample vial guide for scintillation spectrometers or other sample handling systems in which sample vials are moved in a horizontal path to a first operating station, transferred vertically therefrom to a second station such as a radiation measuring chamber, and returned along the vertical path to the first station for continued movement along the horizontal path away from the first station. The sample vial guide includes first and second opposing jaws at the first station on opposite sides of the horizontal path and having opposing interior surfaces which surround and define a constrained area at the first station for a sample vial. The jaws are hinged to pivot laterally away from the horizontal path and include cam surfaces on each jaw for engaging a sample vial as it moves along the horizontal path to or from the first station to move the jaws to an open position to accommodate such horizontal movement of the vial.


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