The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 1980
Filed:
Aug. 13, 1979
John K Silk, Wellesley, MA (US);
Allen S Krieger, Lexington, MA (US);
Eugene W Huang, Lynnfield, MA (US);
American Science and Engineering, Inc., Cambridge, MA (US);
Abstract
An X-ray lithography system for the production of micro-electronic circuits, of the type comprising a mask having detailed circuit patterns thereon which are irradiated by soft X-rays onto a wafer covered with a photosensitive material to replicate the mask patterns, includes an X-ray source spaced from the mask and operative to produce a plurality of input beams of X-rays which are substantially collimated by an array of grazing incidence mirrors to produce a plurality of output X-ray beams which are spaced from one another at the output of the collimator and which are projected in substantially parallel relation to one another toward the mask. Each output beam exhibits a small divergence which causes the several output beams to merge into a single, comparatively large cross-sectional area, composite beam of X-rays at a plane spaced from the collimator. The mask is positioned substantially in said plane for illumination by the composite beam of X-rays. Filters are provided, preferably in the region between the mask and the collimator, for adjusting the spatial uniformity and spectrum of the composite beam.