The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 1980
Filed:
Apr. 26, 1978
Martin Annis, Newton, MA (US);
Edwin Frederick, Concord, MA (US);
American Science and Engineering, Inc., Cambridge, MA (US);
Abstract
A scanning X-ray imaging system produces an image of the transmissivity of objects by producing a relative motion of the object generally perpendicular to the triangular planes joining an X-ray point source and M X-ray line detectors, where M is equal to or greater than 1; these X-rays pass through a scanning slit assembly. The scanning slit assembly generally includes a plane of X-ray opaque material having N sets of line slits, where N is equal to or greater than 2, each set containing M identical line slits. The scanning slit assembly, in addition, includes a rotating X-ray opaque material containing N uniquely different sets of radial slits, each set containing identical radial slits. Each of the N sets of radial slits is uniquely paired with each of the N sets of line slits. During any scan of an object, M detectors, M line slits and one of the N sets of radial slits are used. The scanning X-ray imaging system provides N selections in image resolution of the scanned object. The selectivity provides radiographic images with different contrast resolution and/or spatial resolution.