The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 1980
Filed:
Jul. 17, 1978
Applicant:
Inventor:
Gijsbertus Bouwhuis, Eindhoven, NL;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250201 ; 1791 / ;
Abstract
An apparatus is described for the pointwise scanning of an information surface. By arranging an observation objective system asymmetrically relative to a zero-order subbeam of the radiation coming from the information surface, and by utilizing a detector whose dimension in the scanning direction is small, the resolution can be increased.
Bouwhuis, Gijsbertus. (1980). Apparatus for the pointwise scanning of an information surface (U.S. Patent No. 4242579). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4242579
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile