The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 1980
Filed:
Nov. 20, 1978
Joseph M Geary, Edgewood, NM (US);
David F Holmes, Albuquerque, NM (US);
Abstract
Real time presentation and evaluation of any selected interferogram is realized by electronically simulating optical aberration patterns and displaying them on a cathode ray tube (CRT). The optical aberration patterns include PISTON; X and Y TILT; DEFOCUS; SPHERICAL; COMA; and ASTIGMATISM. The aberration patterns are generated electronically in response to the CRT beam sweep drive signal and are displayed as a function of CRT beam intensity. Any combination of aberration patterns, each having selectable coefficients, can be displayed. The aberration pattern coefficient values are indicated by a digital readout. Evaluation of an unknown interferogram is accomplished by varying aberration pattern combinations and coefficients until a substantial match with the unknown interferogram is achieved. The contributing aberration patterns are then known and their magnitudes are determined from the digital read-out.