The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 1980
Filed:
Jun. 07, 1978
Applicant:
Inventors:
Bengt H Tornblom, Vasteras, SE;
Torborg M Tornblom, Vasteras, SE;
Assignee:
Tornbloms Kvalitetskontroll AB, Vasteras, SE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ;
U.S. Cl.
CPC ...
324225 ; 324227 ; 324232 ; 324237 ;
Abstract
A method and device for nondestructive testing of articles using the eddy principle current and multifrequency technique. The characteristic feature is that the measurement is generally independent of the position of the article to be tested in relation to the pickup probe. In comparison with known devices the present device is easy to handle.