The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 1980

Filed:

May. 22, 1979
Applicant:
Inventors:

Tadao Nakaya, Utsunomiya, JP;

Takashi Kobashi, Utsunomiya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01B / ; G01B / ;
U.S. Cl.
CPC ...
116292 ; 116312 ; 3314 / ;
Abstract

A dial type indicator in which the zero point on a scale fixed to a rotatable tubular outer frame can be set to the position of the pointer by rotating the outer frame around a circular inner frame. An elastic element at one side of the inner frame is pressed against the inner peripheral face of the outer frame by compressing the element in the thickness direction of the inner frame, using a manually adjustable arrangement to compress the element and cause it to extend laterally. In this manner the inner and outer frames can be reliably fastened together without damage to the outer frame and the operability of the outer frame is improved.


Find Patent Forward Citations

Nakaya, Tadao. (1980). Measuring instrument (U.S. Patent No. 4236481). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4236481

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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