The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 1980
Filed:
Apr. 02, 1979
David B Mohler, Tipp City, OH (US);
Ledex, Inc., Vandalia, OH (US);
Abstract
A testing device for applying a force to a material test sample includes a test fixture for engaging the test sample and a solenoid, operatively coupled to the test fixture, for applying a predetermined force to the test sample in response to a solenoid control signal. A strain gauge is mounted on the test fixture and provides an electrical output indicative of the force applied to the test sample. A force setting circuit provides an electrical output indicative of the predetermined force which is to be applied to the test sample. A solenoid control circuit is responsive to the output from the strain gauge element and to the output of the force setting element and provides a control signal to the solenoid such that the predetermined force may be applied to the test sample. The force setting circuit provides an electrical output having an adjustable rate of increase and an adjustable maximum level. A sample circuit monitors the output of the strain gauge to store the peak force applied to the test sample. The testing device also includes a circuit for providing a visual indication of whether the test sample has withstood an adjustable force level.