The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 1980
Filed:
Dec. 08, 1978
Frederick L Maltby, Jenkintown, PA (US);
David M Stern, Merion Station, PA (US);
Drexelbrook Controls, Inc., Horsham, PA (US);
Abstract
A compensated level measuring system is disclosed for measuring the level of the material housed in a vessel, the system incorporating compensation means for compensating for variations in the dielectric constant of the material. A two element measuring system is used, having a first element mounted at a fixed position within the vessel containing the material for obtaining a level signal which is a function of the material level, and a second element maintained within the vessel and always submerged in the material for obtaining a reference signal. Means are provided for adjusting the reference signal so that it can accurately compensate for variations in the level signal which occur independently of the material level. The compensating means is provided either by a mechanical embodiment in which the reference signal is effectively tuned by modifying the position of the reference probe, or electronic means where the effective reference signal is modified by an error function to compensate for errors introduced by changes in the dielectric constant of the material being measured.