The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 1980
Filed:
Sep. 20, 1978
Applicant:
Inventors:
J William Walsh, Baltimore, MD (US);
Raymond E Bietry, Jr, Lake Shawnee, NJ (US);
Assignee:
Becton, Dickinson & Company, East Rutherford, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356340 ; 250574 ;
Abstract
The disclosure relates to a radial scanner usable for scanning a small volume of a test sample in a differential light scattering analyzer. In the scanner a beam of collimated light impinges on a rotating planar mirror located above or below the test sample on an axis passing through the small volume. A beam of light reflected from the mirror sweeps a conical mirror, having its reflecting surface curved about a reference axis passing through the small volume. The small volume is scanned by a beam of light reflected from the conical mirror at different radial angles as the planar mirror is rotated.