The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 1980
Filed:
May. 03, 1978
John W Thompson, Midland, MI (US);
Arthur J Kamp, Midland, MI (US);
Edward R Sederlund, Saginaw, MI (US);
The Dow Chemical Company, Midland, MI (US);
Abstract
A nuclear pulse counting experiment, such as typified by the art of X-ray fluorescence empolys a multichannel analog to digital converter (ADC) which is interfaced with a microprocessor to yield sample/matrix concentration data, as an illustrative example, with a precision which is given by the theoretical nuclear decay statistical limits. In specific regard to X-ray fluorescence analysis, the ADC characterizes each pulse or count according to magnitude without conventional backscatter peak gain stabilization. The data is transferred through a buffer to the microprocessor, which scans the higher energy characterizations for maximum count, identifies that characterization as the peak, .+-. 1 characterization, and interpolates to develop a refined backscatter peak, stated to at least 1/10 of a characterization, and from which data base all ensuing calculations are predicated.