The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 1980

Filed:

Jan. 18, 1978
Applicant:
Inventors:

Naoaki Wakayama, Ibaraki, JP;

Toshiyuki Iida, Wakayama, JP;

Hideshi Yamagishi, Mito, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ; G06G / ;
U.S. Cl.
CPC ...
250374 ; 307230 ;
Abstract

A resistor of a specific resistance value is inserted between a signal line for transmitting ionization chamber current and a logarithmic amplifier. The specific resistance value is selected to be a proper value so that the value of a negative feedback capacitance of the logarithmic amplifier can be made zero or extremely small without instability phenomena such as an overshoot, ringing or oscillation. Accordingly, it is possible that the response time of a logarithmic measuring apparatus is extremely reduced in a small input-current region.


Find Patent Forward Citations

Wakayama, Naoaki. (1980). Method for shortening response time of logarithmic measuring apparatus (U.S. Patent No. 4228355). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4228355

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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