The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 1980
Filed:
Feb. 02, 1978
Kenneth L Ogan, Bethel, CT (US);
The Trustees of Boston University, Boston, MA (US);
Abstract
A spectrometer capable of providing a predetermined wavelength of output light in accordance with a control voltage signal applied to a scanning element is described. The scanning element located at the grating image of the spectrometer is a small mirror attached to the rotor of a galvanometer whose angular position is accurately controlled by a closed-loop electronic control. The spectrum reflected from the mirror is passed through a slit to provide the output light of a predetermined wavelength. Selection of the waveform of the control signal allows the spectrometer to be operated as a dual wavelength spectrometer, to use a linear wavelength scan, or other wavelength scan patterns for absorbance analyses of a sample. The rapid scan capability of this instrument has been utilized to extend the measurement of absorbance changes at one wavelength, corrected for light scattering changes (dual-wavelength spectroscopy), to the measurement of the complete differential absorbance spectrum, similarly corrected for light scattering changes (corrected-differential spectroscopy).