The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 1980
Filed:
Apr. 05, 1979
Gary L Neiheisel, Cincinnati, OH (US);
Bradley R Hoover, Hamilton, OH (US);
Armco Inc., Middletown, OH (US);
Abstract
Automatic defect detecting inspection apparatus for detecting defects or imperfections contained in or on a moving slab or strip. The defect detection apparatus utilizes a linear light source for illuminating a selected portion of the slab or sheet surface and an array of optically sensitive elements arranged in side-by-side relationship to scan the surface of the sheet or slab in a direction transverse to the direction of movement to produce an output video signals corresponding to the optical intensity of the area scanned. An anamorphic optical system comprising spaced cylindrical lenses forming a Galilean telescope positioned between the moving material and the optically sensitive elements increases the sensitivity of the optically sensitive elements in the direction of the material movement while maintaining the sensitivity of the optical elements substantially unchanged in the direction transverse to the material movement.