The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 1980
Filed:
Mar. 20, 1979
Applicant:
Inventors:
Michel Lacombat, Paris, FR;
Serge Volmier-Desperques, Paris, FR;
Assignee:
Thomson-CSF, Paris, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G06K / ;
U.S. Cl.
CPC ...
356394 ;
Abstract
A system for testing a pattern recorded on a plate with a high density in relation to a reference pattern, comprising means for analyzing the pattern with a line detector and a logic circuit for processing the data supplied by the detector and data relating to the reference pattern, the two patterns being described line-by-line. The logic circuit is intended to detect the errors while admitting for each line a shift between the two patterns of one unit in a direction X or in a direction Y perpendicular to X, the maximum shift allowed for the entire pattern amounting, for example, to three units in each direction.