The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 1980

Filed:

Nov. 13, 1978
Applicant:
Inventors:

Robert J Bobel, II, Toledo, OH (US);

Richard H Blausey, Jr, Toledo, OH (US);

Edward D Floyd, Toledo, OH (US);

Donald B Hopings, Toledo, OH (US);

Russell C Retzloff, Maumee, OH (US);

Andrew W Rudolph, Elmore, OH (US);

Assignee:

Libbey-Owens-Ford Company, Toledo, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
3317 / ; 3317 / ; 3317 / ; 33DI / ;
Abstract

An inspection apparatus for determining the contours of sheet material, particularly glass sheets, comprising a checking fixture having a plurality of probe assemblies for determining the exact position of points along the sheet and the deviation, if any, of such measured points from reference points constituting the ideal contour. The probe assemblies generate linear signals transmitted to a controller which, in turn, converts such signals into data displayed on a video screen in selectively different forms.


Find Patent Forward Citations

Bobel, II, Robert. (1980). Inspection apparatus (U.S. Patent No. 4221053). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4221053

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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