The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 1980

Filed:

Jun. 14, 1978
Applicant:
Inventors:

Hiroyuki Mizutani, Yokohama, JP;

Toshio Uehara, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
364414 ; 2504 / ;
Abstract

In a computed tomography system using radiation, a large number of radiation beams are projected into a selected slice-like sectional portion of a subject to be reconstructed, in various directions. A profile of measured projection data is obtained from the radiation beams penetrated in parallel at each given angular interval. The profile of measured projection data thus obtained is subjected to a filtering operation to produce profiles of first modified projection data. The profile of modified projection data is recasted at properly selected intervals to produce second modified projection data. This results in a remarkable reduction of the amount of weight coefficients required in an interpolation to calculate the modified projection data for a large number of picture elements defined in matrix fashion on the sectional portion.


Find Patent Forward Citations

Loading…