The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 1980
Filed:
Jul. 06, 1977
Atushi Ohsumi, Fukuyama, JP;
Yoshinao Yamagishi, Fukuyama, JP;
Kaoru Daigo, Fukuyama, JP;
Tomio Yamamoto, Takamatsu, JP;
Katsuya Yamada, Ooaza Imafuku, Kawagoe-shi, Saitama-ken, JP;
Abstract
An apparatus for detecting the surface flaws of a red-hot metal part includes a light source for illuminating a predetermined area on the surface of a moving red-hot metal part, an image pick-up device for picking-up the image on the metal part surface formed by the light rays from the light source, and a shutter disposed on the optical path between the light receiving surface of the pick-up device and the light source. The reflection energy from the metal part surface corresponding to the incident light rays from the light source is set up to be much larger than the radiation energy of the metal part per se. This relation of energy is set up by adjusting the illumination of the light source. The surface flaws are detected in such a manner that at least one of a series of video signals fed from the image pick-up device after the shutter release is selected as the optimum video signal for flaw detection, and properly selected.