The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 1980
Filed:
Oct. 11, 1978
Applicant:
Inventor:
Kiyozo Koshiishi, Sagamihara, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G01N / ;
U.S. Cl.
CPC ...
364571 ; 364497 ; 2041 / ; 204 / ;
Abstract
A method for measuring ion concentration of a sample solution by detecting a potential difference generated between an ion electrode and a reference electrode which are dipped in the sample solution, while calibrating or compensating variations in a reference point and a span due to a drift, fluctuations of temperature, humidity, voltage supply source and the like with the aid of at least two standard solutions having known ion concentrations. The method comprises