The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 1980
Filed:
Mar. 04, 1976
Applicant:
Inventors:
William J Fies, Portola Valley, CA (US);
Ronald D Smith, Bovingdon, DE;
John R Reeher, Los Gatos, CA (US);
Michael S Story, Los Gatos, CA (US);
Assignee:
Finnigan Corporation, Sunnyvale, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250292 ; 250290 ;
Abstract
Apparatus and method for programming the ion energy of ions being analyzed by a quadruple mass spectrometer where the axis potential applied to the quadruple rods is caused to vary in synchronism with a mass scan in order that the ions of each mass being analyzed may transit the quadruple with the most advantageous energy for proper analysis (that is, with substantially equal velocities) and the application of the ion scan voltage will not distort the fringing field at the entrance to the quadrupole.