The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 1980

Filed:

Nov. 06, 1978
Applicant:
Inventor:

James S Shreve, Fairfax, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356351 ;
Abstract

An improved phase measuring method and apparatus for measuring the relative hase and amplitude of an applied optical signal beam at a number of points in a plane. The combination of the signal beam and a reference beam are simultaneously directed onto a pair of photodector arrays, the reference beam on one array being .pi./2 radians out of phase with the reference beam on the other array. Respective interference patterns are formed on the photodector arrays, points on the arrays are sampled, and the desired amplitude and phase of the signal beam at the sampling points is determined by a series of computational steps.


Find Patent Forward Citations

Loading…