The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 1980
Filed:
Jan. 16, 1978
Applicant:
Inventor:
Koryo Miura, Machida-Shi, Tokyo-To, JP;
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73847 ; 73852 ;
Abstract
In a testing machine a test piece and a reference piece having a known spring constant are superposed with fulcrums interposed between the opposite ends thus establishing a mirror image relationship. A load is applied to the center of the assembly by means of an elastic ring thereby creating a definite relative displacement between the test piece and the reference piece and the relative displacement is measured to determine the bending stiffness of the test piece. According to modified embodiments the torsional stiffness and tension can be measured.
Miura, Koryo. (1980). Method of and apparatus for measuring stiffness (U.S. Patent No. 4213349). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4213349
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile