The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 1980

Filed:

Oct. 18, 1978
Applicant:
Inventors:

Dang T Quang, Paris, FR;

Jacques Leguen, Paris, FR;

Jacques Delair, Paris, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G / ;
U.S. Cl.
CPC ...
250402 ; 313 57 ;
Abstract

A method and circuit arrangement for improving the definition of the focal spots of X-ray tubes which comprises periodically varying the bias voltage applied to the concentrating electrode of the tube, focalizing the eletron beam emitted by the filament, between a negative minimum or zero value and a negative maximum value, with a voltage waveform whose frequency is higher than 10 kilohertz, wherein this bias voltage has to assume at least the two extreme values frequently, while a direct-current high voltage is being applied between the cathode (filament) and the anode (target) during the exposure time.


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