The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 1980
Filed:
Dec. 27, 1977
Applicant:
Inventors:
Richard E Kopp, Smithtown _, NY (US);
Joseph Lisa, Ronkonkoma, NY (US);
Jay Mendelsohn, Old Bethpage, NY (US);
Benjamin J Pernick, Brooklyn, NY (US);
Harvey Stone, Flushing, NY (US);
Martin R Wohlers, Cold Spring Harbor, NY (US);
Assignee:
Grumman Aerospace Corporation, Bethpage, NY (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06M / ;
U.S. Cl.
CPC ...
235 / ; 3401 / ; 3401 / ; 364416 ;
Abstract
A means of probing a biological cell sample with a optical source to determine the characteristics of the cell image by way of measuring parameters from its two dimensional Fourier transform. These techniques lead to a method of measuring discriminating parameters for cell classification.