The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 1980

Filed:

Aug. 11, 1978
Applicant:
Inventor:

Viktor Bodlaj, Munich, DE;

Assignee:

Siemens Aktiengesellschaft, Berlin & Munich, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C / ; G01C / ;
U.S. Cl.
CPC ...
356-1 ; 356-4 ; 356381 ;
Abstract

A device for contact-free measuring of the distance of an object surface from a reference plane by deflecting a beam of light in a path and detecting a beam reflected along a given line of sight by a detector characterized by providing means for measuring the interval of time for travel of the deflected light beam between at least two specific directions of the beam and between at least one of the two directions and a direction at which the photo detector responds and utilizes the time intervals to determine the speed of deflection and determine the distance of the surface from the reference plane.


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Bodlaj, Viktor. (1980). Device for contact-free measuring of the distance of a surface of an (U.S. Patent No. 4212534). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4212534

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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