The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 1980

Filed:

Jul. 03, 1978
Applicant:
Inventors:

Herve J Arditty, 78160 Marly Le Roi, FR;

Matt Lehmann, Menlo Park, CA (US);

Jorlin E Moon, Palo Alto, CA (US);

Sherwyne R Bakar, Saratoga, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C / ; G01B / ; A61B / ;
U.S. Cl.
CPC ...
356-4 ; 351-6 ; 356124 ; 356127 ; 356377 ;
Abstract

An optical probe assembly for detecting the position of an object surface, especially the position of a three-dimensional, curved surface such as a surface in a contact lens or the cornea of the eye, is disclosed herein. This assembly and its method of operation use a beam of light which is focused to a point and an arrangement for automatically causing this point to move or scan in a predetermined way relative to the object surface including reciprocally through the surface for causing light to be reflected back from the latter. During this scanning period, when the beam point is coincident with the object surface, the amount of light which is reflected back along the path of the incident beam is maximized and automatically detected. At the same time, the position of the beam point relative to a known reference is automatically monitored and in combination with the detected light is used for determining the position of the object surface relative to this reference.


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