The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 1980

Filed:

Jul. 27, 1977
Applicant:
Inventors:

Volker Deutsch, Wuppertal-Elberfeld, DE;

Ernst-August Becker, Sprockhovel-Schee, DE;

Ulrich Forstermann, Sprockhovel, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358106 ; 250562 ;
Abstract

A method and device for the automatic detection and evaluation of optical crack indication on the surface of workpieces is disclosed. In such method and device, visual displays are converted into electrical bright-dark signals by the use of light sensitive device, for example, an image recording tube. The surface under observation is scanned by the light-sensitive device line by line, the width of each of which (either as individual line or groups of adjacent lines) corresponds to the maximum optical display width from which evaluation is to proceed. The bright-dark signals thus obtained from three lines or lines groups are compared. From the signal of the middle line or line group and the signals of the two other line or line groups there is formed a difference signal which is evaluated to generate an error evaluation signal of a minimum value is exceeded.


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