The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 1980

Filed:

Nov. 30, 1978
Applicant:
Inventor:

Shoji Kamimura, Katsuta, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
250311 ; 250398 ;
Abstract

An electron microscope comprising an electron gun for generating an electron beam, an electron lens system for irradiating a specimen with the electron beam, an electron lens system for magnifying an electronic image transmitted through the specimen, a fluorescent plate arranged removably in the path of the magnified electron image for converting the magnified transmitted electron image into a visual image, a viewing window for observing the visual image, a CRT display unit for displaying data related to the transmitted electron image, which is arranged at a position where the data is visible from the viewing window, and an optical system for projecting the data on a photo-sensitive material which is exposed to the transmitted electron image.


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