The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 1980
Filed:
Aug. 30, 1978
Lothar Aberle, Sindorf, DE;
Walter Bank, Cologne, DE;
Franz Hillenkamp, Frankfurt, DE;
Raimund Kaufmann, Dusseldorf-Meerbusch, DE;
Rainer Nitsche, Frankfurt, DE;
Eberhard Unsold, Munich, DE;
Reiner Wechsung, Cologne, DE;
Leybold-Heraeus GmbH, Cologne-Bayental, DE;
Abstract
A sample analyzer includes a microscope for alternatively focusing an electromagnetic radiation on the sample to cause ion emission therefrom and visually observing the sample; a mass spectrometer for the mass analysis of the emitted ions; an illuminating device for lighting the sample for the microscopic visual observation thereof; an ion optical system for directing the emitted ions into the mass spectrometer; and a displaceably supported carrier carrying the ion optical system and at least one part of the illuminating device. The carrier has a first position in which the ion optical system is in an operating position in alignment with the sample and a second position in which the illuminating device is in an operating position in alignment with the sample. There is further provided an actuator for selectively moving the carrier into its positions in a direction generally perpendicular to the axis of the ion optical system.